Atomic imaging of an InSe single‐crystal surface with atomic force microscope
نویسندگان
چکیده
منابع مشابه
Force Spectroscopy with the Atomic Force Microscope
Introduction and Review Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. Although the tip-sample interaction may be studied in terms of the energy, the quantity that is measured first is always the tip-sample force, and thus the nomenclature: force spectroscopy....
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 1993
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.354820